Pani, A., P. Shende, M. Dhumal, K. Sangle, and S. Shiravale. “ADVANTAGES OF USING SIFT FOR BRAIN TUMOR DETECTION”. International Journal of Students’ Research in Technology & Management, Vol. 1, no. 3, Sept. 2015, pp. 327-38, http://giapjournals.com/index.php/ijsrtm/article/view/75.